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Built-In Self-Test Last modified: Tuesday, February 07, 2006
Built-In Self-Test is a function of an integrated circuit that can verify all or some of its internal functionality.
Online Built-In Self-Test For Operational Faults (PDF) A practical on-line periodic BIST method for the detection of operational faults in digital systems.	Related Categories Integrated Circuits (ICs) Microprocessors Related Terms ASIC chip flip-flop function I2C integrated circuit nanotechnology routine silicon